Fiber misalignment in silicon V-groove based optical modules

A. Priyadarshi*, L. H. Fen, S. G. Mhaisalkar, V. Kripesh, A. K. Asundi

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

The use of anisotropically etched silicon optical benches (SiOB) and optical adhesives have attracted much attention for the low cost assembly of optical modules. In this paper, the effect of attachment process parameters (such as the amount of bulk adhesive, and the thickness/symmetry of the adhesive layer between the fiber and V-groove walls) on the alignment of the fiber with the laser diode assembled on SiOB, is studied. Finite element analysis (FEA) on the fiber displacement within the V-groove at a given temperature, increases significantly for different thicknesses of adhesive layers, present on either side of the fiber but does not change much with the total amount of adhesive in the module. Validation of the FEA data was accomplished by the use of in situ micro moiré interferometry, involving determination of the displacement of the centre of the fiber in the V-groove exposed to a temperature excursion ranging from room temperature to 125 °C. Maximum displacements of the fiber centre in the vertical and horizontal directions relative to the SiOB were found to range between 0.69-1.21 and 0.36-0.42 μm, respectively at 100 °C. The misalignment results obtained by moiré interferometry matched favorably with the finite element data. The simulation and experimental data in this study indicates that fiber misalignment due to temperature cycling can be reduced significantly if the fiber is located equidistant from the two inclined walls of the Si V-groove.

Original languageEnglish
Pages (from-to)170-184
Number of pages15
JournalOptical Fiber Technology
Volume12
Issue number2
DOIs
Publication statusPublished - Apr 2006
Externally publishedYes

ASJC Scopus Subject Areas

  • Control and Systems Engineering
  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation
  • Electrical and Electronic Engineering

Keywords

  • Adhesive joint
  • FEA
  • Micro moiré interferometry
  • Misalignment
  • Silicon optical bench
  • Single fiber
  • Thermal stress
  • V-groove

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