@article{ae4fdde528d64fa89fd058e035affa75,
title = "Guest Editorial for IRSP 2018 Conference",
author = "Budiman, \{Arief Suriadi\} and Gan, \{Chee Lip\} and Pey, \{Kin Leong\} and Valeriy Sukharev and Olivier Thomas",
year = "2018",
month = dec,
doi = "10.1109/TDMR.2018.2881614",
language = "English",
volume = "18",
pages = "487--489",
journal = "IEEE Transactions on Device and Materials Reliability",
issn = "1530-4388",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "4",
}