High-resolution transmission electron microscopy imaging of carbon nanostructures

Kazu Suenaga*, Yuta Sato, Zheng Liu, Masanori Koshino, Chuanhong Jin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Here we show how a high-resolution transmission electron microscopy can be applied to characterize the carbon nanostructures. Direct imaging of the hexagonal network of carbon nanotube enables us to determine the chiral index and to visualize the topological defects, such as pentagons and heptagons. Individual molecular imaging has also become possible, and atomic structure of fullerene molecules (C60 and C80) has been successfully identified at a single-molecular basis. Some recent progress for in situ observation of the carbon nanotube/fullerene growth and the defect dynamics is also presented.

Original languageEnglish
Title of host publicationAdvances in Carbon Nanomaterials
Subtitle of host publicationScience and Applications
PublisherPan Stanford Publishing Pte. Ltd.
Pages117-130
Number of pages14
ISBN (Print)9789814267878
DOIs
Publication statusPublished - Mar 30 2012
Externally publishedYes

ASJC Scopus Subject Areas

  • General Materials Science
  • General Engineering

Fingerprint

Dive into the research topics of 'High-resolution transmission electron microscopy imaging of carbon nanostructures'. Together they form a unique fingerprint.

Cite this