High temperature in-situ XRD of plasma sprayed HA coatings

S. W.K. Kweh, K. A. Khor*, P. Cheang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Citations (Scopus)

Abstract

The control of phase transformations in plasma sprayed hydroxyapatite (HA) coatings are critical to the clinical performance of the material. This paper reports the use of high temperature X-ray diffraction (HT-XRD) to study, in-situ, the phase transformations occurring in plasma sprayed HA coatings. The coatings were prepared using different spray power levels (net plasma power of 12 and 15kW) and different starting powder size ranges (20-45; 45-75μm). The temperature range employed was room temperature (∼26°C) to 900°C in normal atmosphere and pressure. High temperature differential scanning calorimetry (DSC) was also employed to investigate and determine the precise onset temperature of phase transformations during the recrystallization process. Results showed that actual onset of thermal degradation in the coating into other metastable phases like TTCP, β-TCP and CaO occurred at 638°C. The aforementioned phase transitions were independent of the selected spraying parameters. The degree of melting and thermal dissociation of HA actually determines the amount of calcium phosphate phases that are formed. A high power level of 15kW produced a greater degree of melting, resulting in more CaO, TTCP and β-TCP being formed as a result.

Original languageEnglish
Pages (from-to)381-387
Number of pages7
JournalBiomaterials
Volume23
Issue number2
DOIs
Publication statusPublished - 2002
Externally publishedYes

ASJC Scopus Subject Areas

  • Bioengineering
  • Ceramics and Composites
  • Biophysics
  • Biomaterials
  • Mechanics of Materials

Keywords

  • High temperature phase transformations
  • Hydroxyapatite
  • Plasma spray
  • X-ray diffraction

Fingerprint

Dive into the research topics of 'High temperature in-situ XRD of plasma sprayed HA coatings'. Together they form a unique fingerprint.

Cite this