Impact of thermal, moisture, and mechanical loading conditions on interfacial fracture toughness of adhesively bonded joints

Shane Loo*, Xueren Zhang, Hun Shen Ng, Tong Yan Tee, S. G. Mhaisalkar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

Interfacial delamination is a common failure mode in multilayered IC packages. In this paper, an experimental technique using Brazil-nut specimens is employed to determine the interfacial fracture toughness of an adhesively sandwiched joint with the introduction of edge interfacial crack. The design of experiments (DOE) is applied to study variations in strain rates and the thickness of the sandwich structure. In addition, the effects of moisture content and temperature on the interfacial adhesion are investigated. For the DOEs conducted, as the loading angle increases from 20 °to 90°, the interfacial fracture toughness decreases. The fracture toughness and its corresponding mode mixity are determined from the measured critical load by finite element modeling computation.

Original languageEnglish
Pages (from-to)110-116
Number of pages7
JournalJournal of Electronic Materials
Volume36
Issue number2
DOIs
Publication statusPublished - Feb 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Brazil nut
  • Fracture mechanics
  • Interfacial fracture toughness
  • Sandwich joints

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