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Interdisciplinary characterization of sandwiched SiGe thin layers grown by molecular beam epitaxy
Z. C. Feng, V. Arbet-Engels, R. P.G. Karunasiri, K. L. Wang, F. Watt, K. K. Lee, A. T.S. Wee, H. H. Hng, K. P.J. Williams
Research output: Contribution to conference › Paper › peer-review