Interface transformations in thin film aluminum-gold diffusion couples

C. Xu; T. Sritharan; S. G. Mhaisalkar

doi:10.1016/j.tsf.2007.01.017

Interface transformations in thin film aluminum-gold diffusion couples

C. Xu, T. Sritharan^*, S. G. Mhaisalkar

^*Corresponding author for this work

Nanyang Technological University

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

Interface phase transformations in 1 μm aluminum + 1 μm gold thin film couples upon 24-h isothermal annealing at 125, 150 and 175 °C were studied. It is shown that temperature change does not affect the type of phases formed but only alters their growth rates. The layered structures consisting of multiple intermetallics were identified by X-ray diffraction and electron microscopy. Interface tracking using secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness growth measurements were made and the activation energy calculated to be 33.602 kJ/mol.

Original language	English
Pages (from-to)	5454-5461
Number of pages	8
Journal	Thin Solid Films
Volume	515
Issue number	13
DOIs	https://doi.org/10.1016/j.tsf.2007.01.017
Publication status	Published - May 7 2007
Externally published	Yes

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

Keywords

Al-Au intermetallics
Interface transformation

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10.1016/j.tsf.2007.01.017

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abstract = "Interface phase transformations in 1 μm aluminum + 1 μm gold thin film couples upon 24-h isothermal annealing at 125, 150 and 175 °C were studied. It is shown that temperature change does not affect the type of phases formed but only alters their growth rates. The layered structures consisting of multiple intermetallics were identified by X-ray diffraction and electron microscopy. Interface tracking using secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness growth measurements were made and the activation energy calculated to be 33.602 kJ/mol.",

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AU - Xu, C.

AU - Sritharan, T.

AU - Mhaisalkar, S. G.

PY - 2007/5/7

Y1 - 2007/5/7

N2 - Interface phase transformations in 1 μm aluminum + 1 μm gold thin film couples upon 24-h isothermal annealing at 125, 150 and 175 °C were studied. It is shown that temperature change does not affect the type of phases formed but only alters their growth rates. The layered structures consisting of multiple intermetallics were identified by X-ray diffraction and electron microscopy. Interface tracking using secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness growth measurements were made and the activation energy calculated to be 33.602 kJ/mol.

AB - Interface phase transformations in 1 μm aluminum + 1 μm gold thin film couples upon 24-h isothermal annealing at 125, 150 and 175 °C were studied. It is shown that temperature change does not affect the type of phases formed but only alters their growth rates. The layered structures consisting of multiple intermetallics were identified by X-ray diffraction and electron microscopy. Interface tracking using secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness growth measurements were made and the activation energy calculated to be 33.602 kJ/mol.

KW - Al-Au intermetallics

KW - Interface transformation

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M3 - Article

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 13

ER -

Interface transformations in thin film aluminum-gold diffusion couples

Abstract

ASJC Scopus Subject Areas

Keywords

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