Investigation on Data Retrieval in Emerging Non-Volatile Memory Devices Using Conductive Probe Atomic Force Microscopy

Keyphrases

• Conductivity Probe 100%
• Embedded Nonvolatile Memory (eNVM) 100%
• Stored Data 50%
• Security Concerns 50%
• Low Resistance State 50%
• Digital Forensics 50%
• Static Random Access Memory 50%
• High Resistance State 50%
• Front Surface 50%
• Dynamic Random Access Memory 50%
• Resistance-based 50%

Computer Science

• Data Retrieval 100%
• Non-Volatile Memory 100%
• Security Concern 50%
• Dynamic Random Access Memory 50%
• Data-Stores 50%
• Static Random Access Memory 50%
• Digital Forensics 50%

Engineering

• Data Store 50%
• Dynamic Random Access Memory 50%
• Front Side 50%
• Random Access Memory 50%
• Reliability Availability and Maintainability (Reliability Engineering) 50%