Laser-induced detection sensitivity enhancement with laser pulsing

Alfred C.T. Quah; Choon Meng Chua; Soon Huat Tan; Lian Ser Koh; Jacob C.H. Phang; Tam Lyn Tan; Chee Lip Gan

Laser-induced detection sensitivity enhancement with laser pulsing

Alfred C.T. Quah, Choon Meng Chua, Soon Huat Tan, Lian Ser Koh, Jacob C.H. Phang, Tam Lyn Tan, Chee Lip Gan

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

This article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described.

Original language	English
Pages (from-to)	18-26
Number of pages	9
Journal	Electronic Device Failure Analysis
Volume	10
Issue number	3
Publication status	Published - Aug 2008
Externally published	Yes

ASJC Scopus Subject Areas

Safety, Risk, Reliability and Quality
Electrical and Electronic Engineering

Cite this

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title = "Laser-induced detection sensitivity enhancement with laser pulsing",

abstract = "This article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described.",

author = "Quah, {Alfred C.T.} and Chua, {Choon Meng} and Tan, {Soon Huat} and Koh, {Lian Ser} and Phang, {Jacob C.H.} and Tan, {Tam Lyn} and Gan, {Chee Lip}",

year = "2008",

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journal = "Electronic Device Failure Analysis",

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T1 - Laser-induced detection sensitivity enhancement with laser pulsing

AU - Quah, Alfred C.T.

AU - Chua, Choon Meng

AU - Tan, Soon Huat

AU - Koh, Lian Ser

AU - Phang, Jacob C.H.

AU - Tan, Tam Lyn

AU - Gan, Chee Lip

PY - 2008/8

Y1 - 2008/8

N2 - This article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described.

AB - This article describes a pulsed laser-induced digital signal integration algorithm for pulsed laser operation that is compatible with existing ac-coupled detection systems for fault localization. This algorithm enhances laser-induced detection sensitivity without a lock-in amplifier. The best detection sensitivity is achieved at a pulsing frequency range between 500 Hz and 1.5 kHz. Within this frequency range, the algorithm is capable of achieving more than nine times the enhancement in detection sensitivity. Applications of pulsed TIVA for fault localization are described.

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M3 - Article

AN - SCOPUS:49249108484

SN - 1537-0755

VL - 10

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EP - 26

JO - Electronic Device Failure Analysis

JF - Electronic Device Failure Analysis

IS - 3

ER -

Laser-induced detection sensitivity enhancement with laser pulsing

Abstract

ASJC Scopus Subject Areas

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