Light-induced isotopic exchange between O2 and semiconductor oxides, a characterization method that deserves not to be overlooked

Pierre Pichat*, Henri Courbon, Rosario Enriquez, Timothy T.Y. Tan, Rose Amal

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

39 Citations (Scopus)

Abstract

This article first indicates the various types of temperature-induced oxygen isotopic exchange (OIE) that can occur between labeled gaseous 02 and solid oxides. Earlier main results of light-induced OIE with semiconductor oxides are then briefly reviewed. The core of the article reports new results about the use of light-induced OIE to assess (i) the lability of TiO2 surface O atoms, as altered by calcination or Se deposits, via the comparison of OIE with the photocatalytic removal of methanol in air and (ii) the accessibility of TiO2 affixed on a fiberglass material by means of a silica binder. Both this overview and these novel results illustrate the interest of OIE in heterogeneous photocatalysis.

Original languageEnglish
Pages (from-to)239-250
Number of pages12
JournalResearch on Chemical Intermediates
Volume33
Issue number3-5
DOIs
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • General Chemistry

Keywords

  • Calcination
  • Oxygen isotopic exchange
  • Photocatalysis
  • Semiconductor
  • Titanium dioxide catalyst

Fingerprint

Dive into the research topics of 'Light-induced isotopic exchange between O2 and semiconductor oxides, a characterization method that deserves not to be overlooked'. Together they form a unique fingerprint.

Cite this