Lowering of L10 phase transition temperature of FePt thin films by single shot H+ ion exposure using plasma focus device

Z. Y. Pan, J. J. Lin, T. Zhang, S. Karamat, T. L. Tan, P. Lee, S. V. Springham, R. V. Ramanujan, R. S. Rawat*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)

Abstract

FePt thin films are exposed to pulsed energetic H+ ion beam from plasma focus. In irradiated films, the phase transition from the low Ku disordered face-centered-cubic structure to high Ku ordered face-centered-tetragonal phase was achieved at 400 °C with the order parameter S ranging from 0.73 to 0.83, high coercivity of about 5356 kA/m, high negative nucleation field of about 7700 kA/m and high squareness ratio ranging from 0.73 to 0.79. The advantage of using plasma focus device is that it can lower phase transition temperature and significantly enhance the magnetic properties by a pulsed single shot exposure.

Original languageEnglish
Pages (from-to)2753-2757
Number of pages5
JournalThin Solid Films
Volume517
Issue number8
DOIs
Publication statusPublished - Feb 27 2009
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Keywords

  • FePt
  • Magnetic properties
  • Phase transition
  • Plasma focus
  • Pulsed ion irradiation
  • X-ray diffraction

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