Machine learning for time-resolved emission: Image resolution enhancement

Samuel Chef^*, Chung Tah Chua, Chee Lip Gan

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	24-31
Number of pages	8
Journal	Electronic Device Failure Analysis
Volume	23
Issue number	3
Publication status	Published - Aug 2021
Externally published	Yes

ASJC Scopus Subject Areas

@article{d612e88fdf6e41b0aa89846e900571e6,

title = "Machine learning for time-resolved emission: Image resolution enhancement",

author = "Samuel Chef and Chua, \{Chung Tah\} and Gan, \{Chee Lip\}",

year = "2021",

month = aug,

language = "English",

volume = "23",

pages = "24--31",

journal = "Electronic Device Failure Analysis",

issn = "1537-0755",

publisher = "ASM International",

number = "3",

}

TY - JOUR

T1 - Machine learning for time-resolved emission

T2 - Image resolution enhancement

AU - Chef, Samuel

AU - Chua, Chung Tah

AU - Gan, Chee Lip

PY - 2021/8

Y1 - 2021/8

UR - http://www.scopus.com/inward/record.url?scp=85117531713&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85117531713&partnerID=8YFLogxK

M3 - Article

AN - SCOPUS:85117531713

SN - 1537-0755

VL - 23

SP - 24

EP - 31

JO - Electronic Device Failure Analysis

JF - Electronic Device Failure Analysis

IS - 3

ER -