Abstract
Magnetic microscopy has proven its usefulness throughout the years. It allows current localization with a certain degree of precision by using an inversion algorithm to invert the Biot-Savart law. The goal is to obtain the current distribution once the magnetic field is given. However, in order to obtain a stable solution, the magnetic data is severely low-pass filtered in the spatial Fourier domain, and some important information is lost. In this paper, the contribution given by the different spatial frequencies was studied: it was demonstrated how this information can be used to obtain additional information regarding the position of the currents. A comparative study between the theoretical approach and the application to the measurements is also shown.
Original language | English |
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Pages (from-to) | 1684-1688 |
Number of pages | 5 |
Journal | Microelectronics Reliability |
Volume | 51 |
Issue number | 9-11 |
DOIs | |
Publication status | Published - 2011 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Safety, Risk, Reliability and Quality
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering