Materials and electrical characterization of Er (Si1-x Gex) 2-y films formed on Si1-x Gex (001) (x=0-0.3) via Rapid Thermal Annealing

E. J. Tan*, K. L. Pey, D. Z. Chi, P. S. Lee, Y. Setiawan, K. M. Hoe

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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