Microwave surface transport in narrow-bandgap PdSe2-MOSFETs

R. Le Goff*, M. Rosticher, Y. Peng, Z. Liu, T. Taniguchi, K. Watanabe, J. M. Berroir, E. Bocquillon, G. Fève, C. Voisin, J. Chazelas, B. Plaçais*, E. Baudin*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

Group-10 transition-metal dichalcogenides are puckered van der Waals semiconductors, with a narrow bandgap, envisioned for ultra-broadband infrared (IR) detection. To assess their dynamical transport properties we investigate PdSe2 n-MOSFETs by using microwave admittance spectroscopy. We report on surface channel inversion-depletion-accumulation behaviors with a depletion length of 15 nm, a mobility of 110 cm2 V1 s1, and a bulk bandgap of 0.15 eV. Our 10 µm long devices have an electronic cut-off frequency in the GHz range promising a large gain-bandwidth product, competitive with that of III–V (InAs) and II–VI (HgCdTe) devices. The integration of bulk absorption and surface readout in PdSe2-MOSFETs is a monolithic geometry suitable for fast IR detection in the application-rich 1–10 µm range, which includes molecular spectroscopy, atmospheric communications and thermal sensing.

Original languageEnglish
Article number035035
Journal2D Materials
Volume8
Issue number3
DOIs
Publication statusPublished - Jul 2021
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2021 The Author(s). Published by IOP Publishing Ltd

ASJC Scopus Subject Areas

  • General Chemistry
  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Keywords

  • Microwave
  • MOSFET
  • PdSe2
  • Photodetection
  • Transistor

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