Multiple electrical breakdowns and electrical annealing using high current approximating breakdown current of silver nanowire network

Farhan Nur Kholid, Hui Huang, Yongqi Zhang, Hong Jin Fan

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Abstract

The failure of a silver nanowire (AgNW) random network due to high electric current density is described. The AgNW network breaks down as result of electromigration and Joule heating at junctions, which leads to destroyed interconnections between AgNWs. The AgNW network is not completely destroyed after breakdown, but instead is able to undergo multiple breakdowns after being cooled down, with increased resistance and reduced breakdown current density. The breakdown current density of AgNW network is Jmax = 25 A cm-2 for a network with Rs 40 ω sq-1 outperforming a CuNW network. An effective electrical annealing method is demonstrated to decrease network resistance by 18% by periodically applying high current that is slightly lower than breakdown current with a period of 1 min for a few cycles.

Original languageEnglish
Article number025703
JournalNanotechnology
Volume27
Issue number2
DOIs
Publication statusPublished - Jan 1 2016
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2016 IOP Publishing Ltd Printed in the UK.

ASJC Scopus Subject Areas

  • Bioengineering
  • General Chemistry
  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering
  • Electrical and Electronic Engineering

Keywords

  • electrical annealing
  • electrical breakdown
  • joule heating
  • percolating network
  • silver nanowire network
  • transparent conductive film

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