TY - JOUR
T1 - Nanoscale phase separation in quasi-uniaxial and biaxial strained multiferroic thin films
AU - Qi, Yajun
AU - Huang, Chuanwei
AU - Chen, Zuhuang
AU - Luo, Zhenlin
AU - Wang, Yiqian
AU - Guo, Jun
AU - White, Tim
AU - Wang, Junling
AU - Gao, Chen
AU - Sritharan, Thirumany
AU - Chen, Lang
PY - 2011/9/26
Y1 - 2011/9/26
N2 - Nanoscale phase separation was investigated in epitaxial strained BiFeO3 thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones.
AB - Nanoscale phase separation was investigated in epitaxial strained BiFeO3 thin films on LaAlO3 single crystal substrate. In biaxial strained thin films, nanoscale mixtures of the tetragonal-like and rhombohedral-like phases occur with a film thickness above 35 nm. For 10-30 nm ultrathin ones, tetragonal-like single phase is confirmed using synchrotron x-ray and the atomic force microscopy studies. However, nanoscale phase separations are still observed in quasi-uniaxial transmission electron microscopy foil specimens for those ultrathin films, indicating the phase separation emerges in a much smaller thickness in uniaxial constraint films than that in biaxial ones.
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U2 - 10.1063/1.3644958
DO - 10.1063/1.3644958
M3 - Article
AN - SCOPUS:80053478889
SN - 0003-6951
VL - 99
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 13
M1 - 132905
ER -