Nickel silicide formation using multiple-pulsed laser annealing

Y. Setiawan*, P. S. Lee, K. L. Pey, X. C. Wang, G. C. Lim, F. L. Chow

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

The effect of multiple-pulsed laser irradiation on Ni silicide formation in Ni (Ti) Si system was studied. A layered structure consisting of both crystalline Ni Si2 and Ni-rich Ni-Si amorphous phases with a protective Ti Ox overlayer was formed after five-pulsed laser annealing at 0.4 J cm-2. Different solidification velocities caused by a variation in the atomic concentration across the melt have led to the formation of this layered structure. On the other hand, by increasing the number of laser pulses, a continuous layer of polycrystalline NiSi was obtained after a 20-pulsed laser annealing at 0.3 J cm-2 laser fluence. Its formation is attributed to a better elemental mixing which occurred during subsequent pulses. Enhancement of surface absorption and remelting of the phases formed is proposed as the mechanism governing the continuous NiSi layer formation.

Original languageEnglish
Article number034307
JournalJournal of Applied Physics
Volume101
Issue number3
DOIs
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • General Physics and Astronomy

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