Abstract
This paper considers the general properties of polarising microscopes and, in particular, light polarisation changes produced by high aperture lenses. A method is suggested for vectorial ray tracing of complex optical systems and to model high aperture lenses. The two principal arrangements of polarising microscopes (linearly and circularly polarised) are also considered. We discuss the effect of pinhole size on the detected intensity. A theory for point resolution of these microscopes is also presented and results are analysed. We support our theoretical predictions with experimental data.
| Original language | English |
|---|---|
| Pages (from-to) | 300-315 |
| Number of pages | 16 |
| Journal | Optics Communications |
| Volume | 148 |
| Issue number | 4-6 |
| DOIs | |
| Publication status | Published - Mar 15 1998 |
| Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering
Keywords
- Confocal microscopy
- Diffraction
- Focusing
- High-aperture
- Scanning optical microscopy
- Vectorial theory