Abstract
Recent growth of power converter market has been driven largely by the growing demand for an efficient way to convert and distribute energy in the field of electrical vehicles, renewable energy, and aerospace and marine applications. However, failures of power semiconductor devices can reduce the reliability of power converters. It is well-known that the reliability of power semiconductor devices is related to the device junction temperatures. This paper presents an online temperature estimation model for off-the-shelf power converters that estimates the junction temperatures of insulated gate bipolar transistors (IGBTs) in real time. The proposed online model is based on power loss characteristics and thermal-impedance variation for each interval in the operating states of IGBTs. A three-phase power converter consisting of three half-bridge IGBT modules has been built as an experimental test setup to verify the proposed method. To validate the accuracy of the proposed method, the estimated temperatures are compared to the results from temperature measurement by using a thermocouple and an infrared camera.
Original language | English |
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Title of host publication | APEC 2018 - 33rd Annual IEEE Applied Power Electronics Conference and Exposition |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 2769-2774 |
Number of pages | 6 |
ISBN (Electronic) | 9781538611807 |
DOIs | |
Publication status | Published - Apr 18 2018 |
Externally published | Yes |
Event | 33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 - San Antonio, United States Duration: Mar 4 2018 → Mar 8 2018 |
Publication series
Name | Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC |
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Volume | 2018-March |
Conference
Conference | 33rd Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2018 |
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Country/Territory | United States |
City | San Antonio |
Period | 3/4/18 → 3/8/18 |
Bibliographical note
Publisher Copyright:© 2018 IEEE.
ASJC Scopus Subject Areas
- Electrical and Electronic Engineering
Keywords
- Insulated Gate Bipolar Transistor (IGBT)
- Junction temperature
- Power loss
- Switching loss
- Transient thermal impedance