Out-of-distribution detection in multi-label datasets using latent space of ß-VAE

Vijaya Kumar Sundar, Shreyas Ramakrishna, Zahra Rahiminasab, Arvind Easwaran, Abhishek Dubey

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Citations (Scopus)

Abstract

Learning Enabled Components (LECs) are widely being used in a variety of perceptions based autonomy tasks like image segmentation, object detection, end-to-end driving, etc. These components are trained with large image datasets with multimodal factors like weather conditions, time-of-day, traffic-density, etc. The LECs learn from these factors during training, and while testing if there is variation in any of these factors, the components get confused resulting in low confidence predictions. Those images with factor values, not seen, during training are commonly referred to as Out-of-Distribution (OOD). For safe autonomy, it is important to identify the OOD images, so that a suitable mitigation strategy can be performed. Classical one-class classifiers like SVM and SVDD are used to perform OOD detection. However, multiple labels attached to images in these datasets restrict the direct application of these techniques. We address this problem using the latent space of the $\beta$ -Variational Autoencoder ($\beta$ -VAE). We use the fact that compact latent space generated by an appropriately selected $\beta$ - VAE will encode the information about these factors in a few latent variables, and that can be used for quick and computationally inexpensive detection. We evaluate our approach on the nuScenes dataset, and our results show the latent space of $\beta$ - VAE is sensitive to encode changes in the values of the generative factor.

Original languageEnglish
Title of host publicationProceedings - 2020 IEEE Symposium on Security and Privacy Workshops, SPW 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages250-255
Number of pages6
ISBN (Electronic)9781728193465
DOIs
Publication statusPublished - May 2020
Externally publishedYes
Event2020 IEEE Symposium on Security and Privacy Workshops, SPW 2020 - Virtual, San Francisco, United States
Duration: May 21 2020 → …

Publication series

NameProceedings - 2020 IEEE Symposium on Security and Privacy Workshops, SPW 2020

Conference

Conference2020 IEEE Symposium on Security and Privacy Workshops, SPW 2020
Country/TerritoryUnited States
CityVirtual, San Francisco
Period5/21/20 → …

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

ASJC Scopus Subject Areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Civil and Structural Engineering
  • Safety, Risk, Reliability and Quality
  • Analysis

Keywords

  • Disentanglement
  • KL-divergence
  • Out-of-Distribution
  • VAE

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