Abstract
A method using dip-pen nanolithography (DPN) to generate patterns of cobalt nanoparticles with feature sizes ranging from micrometers to sub-70 nm was reported. Atomic force microscopy (AFM) images of dot and line patterns of Co NPs are found to generate DPN on cleaned Si/SiOx substrates. The results show that despite the sub-70 nm dots generated by DPN, the growth of CNTs on small patterns is nonuniform, low-yield, and more difficult to control. The catalyst NP on its tip side collides with another NP on the surface, to form a bigger particle. The Co NP catalyst is observed at the root end of the CNT in the DPN-patterned area, proving that the base-growth mechanism of CNTs. It is also found that the availability of massively parallel DPN systems offer the possibility of rapid production of large-area catalyst patterns.
Original language | English |
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Pages (from-to) | 4873-4878 |
Number of pages | 6 |
Journal | Advanced Materials |
Volume | 20 |
Issue number | 24 |
DOIs | |
Publication status | Published - Dec 17 2008 |
Externally published | Yes |
ASJC Scopus Subject Areas
- General Materials Science
- Mechanics of Materials
- Mechanical Engineering