Abstract
A lead-free glass frit paste as a die-attach material for high-temperature microelectronic application is proposed in this study. The glass paste containing Bi-based powder with a moderate amount of solvent was used for joining Si dice on ceramic substrates without any metallization preparation for either of the bonding surfaces. The die was bonded to a ceramic substrate at 430 C for 10 min. The study focuses on the mechanical and microstructural characterization of the joints with Si dice on two different types of ceramic substrate. Shear strength measurements were carried out at both ambient and 250 C to evaluate room- and high-temperature performance. Furthermore, the effect of aging at 300 C for 500 h on the mechanical properties is presented. The results of the mechanical and microstructural characterization demonstrate that low-temperature glass frit bonding is an effective die-attach method for harsh-environment electronic packaging.
Original language | English |
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Pages (from-to) | 2667-2676 |
Number of pages | 10 |
Journal | Journal of Electronic Materials |
Volume | 42 |
Issue number | 8 |
DOIs | |
Publication status | Published - Aug 2013 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering
- Materials Chemistry
Keywords
- ceramic substrates
- die attach
- glass paste
- high-temperature reliability
- Ruggedized electronics