Abstract
In planar diffractive imaging systems, extra-axial imaging elements are frequently used. Since the elements have large off-axial aberrations such as coma, astigmatism, field curvature and distortion, it seems a little difficult to design a practical aberration-free element. In this paper, we reviewed the axial imaging diffractive element design procedure. Referring to designing axial elements, we present a semianalytical approach that enables one to determine the exact surface profile of an extra-axial element based on geometrical optics according to design and aberration-free requirements. The design procedure of the element can be divided into two steps: firstly to obtain the zone boundaries and then to solve the exact surface profile. Finally, a schematic is given to test and evaluate small size diffractive elements.
Original language | English |
---|---|
Pages (from-to) | 632-639 |
Number of pages | 8 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3897 |
Publication status | Published - 1999 |
Externally published | Yes |
Event | Proceedings of the 1999 Advanced Photonic Sensors and Applications - Singapore, Singapore Duration: Nov 30 1999 → Dec 3 1999 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering