Abstract
In this work we discuss the role of polarisation in confocal microscopy. The effect of the optical system on light polarisation is analysed in the absence of a specimen. We also present numerical results on confocal microscopes imaging small dielectric scatterers and suggest an optimum pinhole size for crossed linear polars. Finally, imaging of large spherical scatterers and contrast optimisation of the optical system is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 22-26 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3261 |
| DOIs | |
| Publication status | Published - 1998 |
| Externally published | Yes |
| Event | Proceedings of Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing V - San Jose, CA, United States Duration: Jan 27 1998 → Jan 29 1998 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- Confocal microscopy
- High aperture theory
- Polarised light
- Vectorial theory