Polarization correlation and pyroelectric properties of Pb(Zr, Ti)O3 and La doped Pb(Zr, Ti)O3 multilayer thin films

W. Liu*, B. Jiang, J. S. Ko, O. Tan, W. Zhu

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Polarization correlation was found in the alternatively deposited Pb(Zr, Ti)O3 (PZT 30/70) and La doped Pb(Zr, Ti)O3 (PLZT 17/30/70) multilayered thin films prepared by a modified sol-gel process. HRTEM results revealed that the multilayered thin films had their (111)-preferred orientation and crystalline size of 300 nm. Dielectric constants and losses at 1 kHz for the un-poled sample and the sample poled at 357 kV/cm were 880, 800, and 0.022, 0.019 respectively. A high pyroelectric current was observed in the PZT/PLZT multilayered thin film near the PLZT phase transition point even after several thermal cycles above the phase transition temperature of the PLZT layer. This phenomenon was termed as the self-biased dielectric bolometer (SBDB) effect, and was attributed to the induced polarization in PLZT layers by the remnant polarization in their adjacent PZT layers.

Original languageEnglish
Pages (from-to)47-54
Number of pages8
JournalIntegrated Ferroelectrics
Volume35
Issue number1-4
DOIs
Publication statusPublished - 2001
Externally publishedYes
Event12th Interntional Symposium on Integrated Ferroelectrics - Aachen, Germany
Duration: Mar 12 2000Mar 15 2000

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Control and Systems Engineering
  • Ceramics and Composites
  • Condensed Matter Physics
  • Electrical and Electronic Engineering
  • Materials Chemistry

Keywords

  • Multilayer thin films
  • Polarization correlation
  • Pyroelectricity

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