Preliminary characterization of an intrinsic germanium detector on a 400‐keV microscope

T. J. White; D. R. Cousens; G. J. Auchterlonie

doi:10.1111/j.1365-2818.1991.tb03148.x

Preliminary characterization of an intrinsic germanium detector on a 400‐keV microscope

T. J. White^*, D. R. Cousens, G. J. Auchterlonie

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

An evaluation was made of an intrinsic germanium X‐ray detector fitted to a 400‐keV electron microscope. Its characteristics as a function of accelerating voltage, pulse processor settings and count rate were investigated. Comparisons are drawn between intrinsic Ge and Si(Li) detectors at both an experimental and theoretical level. The software requirements for the successful collection of spectra are discussed. 1991 Blackwell Science Ltd

Original language	English
Pages (from-to)	379-390
Number of pages	12
Journal	Journal of Microscopy
Volume	162
Issue number	3
DOIs	https://doi.org/10.1111/j.1365-2818.1991.tb03148.x
Publication status	Published - Jun 1991
Externally published	Yes

ASJC Scopus Subject Areas

Pathology and Forensic Medicine
Histology

Keywords

collection efficiency
intrinsic Ge
k‐factors
Microanalysis
quantification
theory

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10.1111/j.1365-2818.1991.tb03148.x

Cite this

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abstract = "An evaluation was made of an intrinsic germanium X‐ray detector fitted to a 400‐keV electron microscope. Its characteristics as a function of accelerating voltage, pulse processor settings and count rate were investigated. Comparisons are drawn between intrinsic Ge and Si(Li) detectors at both an experimental and theoretical level. The software requirements for the successful collection of spectra are discussed. 1991 Blackwell Science Ltd",

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year = "1991",

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doi = "10.1111/j.1365-2818.1991.tb03148.x",

language = "English",

volume = "162",

pages = "379--390",

journal = "Journal of Microscopy",

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AU - White, T. J.

AU - Cousens, D. R.

AU - Auchterlonie, G. J.

PY - 1991/6

Y1 - 1991/6

N2 - An evaluation was made of an intrinsic germanium X‐ray detector fitted to a 400‐keV electron microscope. Its characteristics as a function of accelerating voltage, pulse processor settings and count rate were investigated. Comparisons are drawn between intrinsic Ge and Si(Li) detectors at both an experimental and theoretical level. The software requirements for the successful collection of spectra are discussed. 1991 Blackwell Science Ltd

AB - An evaluation was made of an intrinsic germanium X‐ray detector fitted to a 400‐keV electron microscope. Its characteristics as a function of accelerating voltage, pulse processor settings and count rate were investigated. Comparisons are drawn between intrinsic Ge and Si(Li) detectors at both an experimental and theoretical level. The software requirements for the successful collection of spectra are discussed. 1991 Blackwell Science Ltd

KW - collection efficiency

KW - intrinsic Ge

KW - k‐factors

KW - Microanalysis

KW - quantification

KW - theory

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U2 - 10.1111/j.1365-2818.1991.tb03148.x

DO - 10.1111/j.1365-2818.1991.tb03148.x

M3 - Article

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VL - 162

SP - 379

EP - 390

JO - Journal of Microscopy

JF - Journal of Microscopy

IS - 3

ER -

Preliminary characterization of an intrinsic germanium detector on a 400‐keV microscope

Abstract

ASJC Scopus Subject Areas

Keywords

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