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Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system
R. M. Langford*, Y. Z. Huang, S. Lozano-Perez, J. M. Titchmarsh, A. K. Petford-Long
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
36
Citations
(Scopus)