Property study of TbFeCo for all-optical magnetic recording

M. L. Lee, C. H. Lim, K. L. Toh, C. L. Gan, J. M. Li, L. P. Shi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Thin films properties of amorphous TbFeCo were studied to determine its suitability for use in all optical magnetic recording. Ellipsometric techniques have been used to determine the optical properties of the films in the wavelength range of 350 to 800 nm. The effects of film thickness, Ar flow rate and presence of Ag under layer on magnetic properties were also investigated.

Original languageEnglish
Title of host publicationOptical Data Storage 2010
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventOptical Data Storage 2010 - Boulder, CO, United States
Duration: May 23 2010May 26 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7730
ISSN (Print)0277-786X

Conference

ConferenceOptical Data Storage 2010
Country/TerritoryUnited States
CityBoulder, CO
Period5/23/105/26/10

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Amorphous thin film
  • Coercivity
  • Magnetic properties
  • Optical properties

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