Quantitative, nanoscale mapping of sp2 percentage and crystal orientation in carbon multilayers

M. Bosman*, V. J. Keast, M. Watanabe, D. G. McCulloch, M. Shakerzadeh, E. H.T. Teo, B. K. Tay

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

27 Citations (Scopus)

Abstract

Experimental and analytical techniques are introduced for the quantitative, nanoscale mapping of chemical bonding information in carbon-based materials. With these techniques, the spatial orientation of graphitic crystallites in tetrahedrally bonded amorphous carbon was imaged. Simultaneously, the percentage of sp2- and sp3-bonded carbon could be mapped quantitatively, all with spatial resolution of just a few nanometers. Two electron energy-loss spectroscopy (EELS) techniques were compared: low-loss mapping of the plasmon energy and core-loss mapping of the carbon ionization edge. The recently developed EELS acquisition routine of binned gain averaging was applied, together with multivariate statistical analysis, providing a robust method for obtaining real-space, two-dimensional bonding maps.

Original languageEnglish
Pages (from-to)94-101
Number of pages8
JournalCarbon
Volume47
Issue number1
DOIs
Publication statusPublished - Jan 2009
Externally publishedYes

ASJC Scopus Subject Areas

  • General Chemistry
  • General Materials Science

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