Refractive indices of textured indium tin oxide and zinc oxide thin films

Y. Yang, X. W. Sun*, B. J. Chen, C. X. Xu, T. P. Chen, C. Q. Sun, B. K. Tay, Z. Sun

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

80 Citations (Scopus)

Abstract

The refractive indices of textured indium tin oxide (ITO) and zinc oxide (ZnO) thin films were measured and compared. The ITO thin film grown on glass and ZnO buffered glass substrates by sputtering showed distinct differences; the refractive index of ITO on glass was about 0.05 higher than that of ITO on ZnO buffered glass in the whole visible spectrum. The ZnO thin film grown on glass and ITO buffered glass substrates by filtered vacuum arc also showed distinct differences; the refractive index of ZnO on glass was higher than that of ZnO on ITO buffered glass in the red and green region, but lower in the blue region. The largest refractive index difference of ZnO on glass and ITO buffered glass was about 0.1 in the visible spectrum. The refractive index variation was correlated with the crystal quality, surface morphology and conductivity of the thin films.

Original languageEnglish
Pages (from-to)95-101
Number of pages7
JournalThin Solid Films
Volume510
Issue number1-2
DOIs
Publication statusPublished - Jul 3 2006
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Keywords

  • Conductivity
  • Ellipsometry
  • Indium tin oxide
  • Optical constants
  • Zinc oxide

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