Replication of the nano-scale mold fabricated with focused ion beam

J. X. Gao, M. B. Chan-Park*, D. Z. Xie, B. K.A. Ngoi

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Silicon mold fabricated with Focused Ion Beam lithography (FIB) was used to make silicone elastomer molds. The silicon mold is composed of lattice of holes which the diameter and depth are about 200 nm and 60 nm, respectively. The silicone elastomer material was then used to replicate slavery mold. Our study show the replication process with the elastomer mold had been performed successfully and the diameter of humps on the elastomer mold is near to that of holes on the master mold. But the height of humps in the elastomer mold is only 42 nm and it is different from the depth of holes in the master mold.

Original languageEnglish
Article number149
Pages (from-to)637-641
Number of pages5
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5774
DOIs
Publication statusPublished - 2005
Externally publishedYes
EventFifth International Conference on Thin Film Physics and Applications - Shanghai, China
Duration: May 31 2004Jun 2 2004

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Keywords

  • Elastomer
  • Mold
  • Replication
  • Silicon

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