Abstract
To recover decoding errors caused by data retention noise in NAND Flash memory, a novel retention-Aware belief-propagation (RA-BP) decoding scheme is proposed. The RA-BP scheme is based on two rounds of BP decoding in which the memory cell's charge-loss effect is systematically compensated. The most prominent feature of the proposed RA-BP scheme is that it recovers the retention-failure decoded data without performing additional memory sensing operations. Instead, the likely retention-failure memory cells are identified by using the available readback voltage signal and the decoded codeword bits. For all such likely retention-failure memory cells, the corresponding log-likelihood ratio information is modified in such a way as to reverse the effect of retention noise, and a second round of BP decoding is performed afresh. Through numerical simulations, it is shown that the proposed RA-BP decoding scheme can improve the error rate performance by more than three orders of magnitude and increase the retention time limit by up to 60% compared with a single round of BP decoding.
Original language | English |
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Article number | 7551127 |
Pages (from-to) | 725-729 |
Number of pages | 5 |
Journal | IEEE Transactions on Circuits and Systems II: Express Briefs |
Volume | 64 |
Issue number | 6 |
DOIs | |
Publication status | Published - Jun 2017 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2004-2012 IEEE.
ASJC Scopus Subject Areas
- Electrical and Electronic Engineering
Keywords
- Belief-propagation (BP) decoding
- data retention noise
- error rate performance
- NAND Flash memory
- retentionfailure recovery.