Abstract
We derive a rigorous theory for the imaging plane reflectors in confocal microscopes. The theory employs a full electromagnetic treatment that is applicable to lenses with high apertures. We show how the polarisation of the illuminating light and the size of either a coherent or an incoherent detector affects the axial resolution of the optical system. Numerical examples are also given for some important cases.
Original language | English |
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Pages (from-to) | 127-135 |
Number of pages | 9 |
Journal | Optics Communications |
Volume | 137 |
Issue number | 1-3 |
DOIs | |
Publication status | Published - Apr 15 1997 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering
Keywords
- Confocal microscopy
- Diffraction
- Focusing
- High-aperture
- Scanning optical microscopy
- Vectorial theory