Rigorous theory for axial resolution in confocal microscopes

P. Török*, T. Wilson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

52 Citations (Scopus)

Abstract

We derive a rigorous theory for the imaging plane reflectors in confocal microscopes. The theory employs a full electromagnetic treatment that is applicable to lenses with high apertures. We show how the polarisation of the illuminating light and the size of either a coherent or an incoherent detector affects the axial resolution of the optical system. Numerical examples are also given for some important cases.

Original languageEnglish
Pages (from-to)127-135
Number of pages9
JournalOptics Communications
Volume137
Issue number1-3
DOIs
Publication statusPublished - Apr 15 1997
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Physical and Theoretical Chemistry
  • Electrical and Electronic Engineering

Keywords

  • Confocal microscopy
  • Diffraction
  • Focusing
  • High-aperture
  • Scanning optical microscopy
  • Vectorial theory

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