Ruggedized sensor packaging with advanced die attach and encapsulation material for harsh environment

Y. S. Tay, L. Yang, H. Zhang, H. B. Kor, L. Zhang, H. Liu, V. Gill, A. Lambourne, K. H.H. Li, Z. Chen, C. L. Gan*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

Current gas sensors are typically graded for performance up to 100 °C and limited by the materials used in their packaging. This work aims to select, design and investigate novel materials for die attach and encapsulation technology, such as copper nanoparticles-based die attach and phthalonitrile-based encapsulant, for the fabrication of a packaged gas sensor for harsh environment applications. This is done through a series of test protocols and reliability assessments developed to simulate operations at high temperature and under strong vibration.

Original languageEnglish
Article number115115
JournalMicroelectronics Reliability
Volume150
DOIs
Publication statusPublished - Nov 2023
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2023

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Keywords

  • High-temperature vibration fatigue
  • NanoCu die attach
  • Phthalonitrile-based encapsulant
  • Thermal cycling
  • Vibration sweep

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