Security Evaluation of Microcontrollers: A Case Study in Smart Watches

Xiaomei Zeng*, Qing Liu, Chung Tah Chua, Samuel Chef, Chee Lip Gan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Smart watches contain sensitive information like application software, user health and fitness data. Some of these data are often stored in embedded flash memory in microcontrollers. Here we explore two flash memory reading techniques to evaluate data security in smart watches against hardware attacks. One technique is the common approach of logical data acquisition, which is non-invasive and access the data through debug interface. It dumps the whole flash memory content based on its logical address. The other technique is a new selective staining approach. It extracts data directly from memory cells and requires invasive sample preparation. It extracts all binary bits in the flash memory based on its physical address. These two techniques are complementary to one another and ensure the accuracy of extracted memory content. The nature of data in the flash memory was confirmed by comparing the data between a new and a used watch. Majority of the flash memory was used for application software, with a small region found reserved to store the last shutdown information of the watch.

Original languageEnglish
Title of host publication2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350301649
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023 - Pulau Pinang, Malaysia
Duration: Jul 24 2023Jul 27 2023

Publication series

NameProceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Volume2023-July

Conference

Conference2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2023
Country/TerritoryMalaysia
CityPulau Pinang
Period7/24/237/27/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

ASJC Scopus Subject Areas

  • Electrical and Electronic Engineering

Keywords

  • hardware security
  • logical data acquisition
  • selective staining
  • smart watch

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