Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

Etienne Navarro, Thomas W. Cornelius, Henry Proudhon, Rahul Sahay, Ihor Radchenko, Stéphanie Escoubas, Pooi See Lee, Nagarajan Raghavan, Arief S. Budiman, Olivier Thomas*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Face-centered cubic/body centered cubic (FCC/BCC) nanolaminates prepared by Accumulative Roll Bonding (ARB) have been extensively studied because of their unique mechanical properties. Recently, micro-beam bending experiments, performed on Cu/Nb ARB samples, have shown an anisotropic interface sliding behavior linked to the strong in-plane texture. To test interface sliding on a macroscale we have developed a shear test based upon a specific sample geometry and on in situ tensile loading on an X-ray synchrotron beamline. As received nanolaminate samples exhibit a very anisotropic crystallographic texture as expected from the fabrication process. In situ X-ray diffraction in the sheared zone during mechanical loading yields strains in Cu and Nb. Early brittle failure prevents investigating further the sliding at interfaces. This is probably caused by crack initiation from the inner surfaces of the notches used to induce shear.

Original languageEnglish
Article number111999
JournalMicroelectronic Engineering
Volume276
DOIs
Publication statusPublished - May 1 2023
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2023

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

Keywords

  • Accumulative Rolll bonding
  • Interface sliding
  • Mechanical behavior
  • Synchrotron radiation
  • X-ray diffraction

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