Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

Etienne Navarro, Thomas W. Cornelius, Henry Proudhon, Rahul Sahay, Ihor Radchenko, Stéphanie Escoubas, Pooi See Lee, Nagarajan Raghavan, Arief S. Budiman, Olivier Thomas*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction'. Together they form a unique fingerprint.

Keyphrases

Engineering

Material Science

Physics