Solid-Ionic Memory in a van der Waals Heterostructure

Jieqiong Chen, Rui Guo, Xiaowei Wang, Chao Zhu, Guiming Cao, Lu You, Ruihuan Duan, Chao Zhu, Shreyash Sudhakar Hadke, Xun Cao, Teddy Salim, Pio John S. Buenconsejo, Manzhang Xu, Xiaoxu Zhao, Jiadong Zhou, Ya Deng, Qingsheng Zeng, Lydia H. Wong, Jingsheng Chen*, Fucai Liu*Zheng Liu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

6 Citations (Scopus)

Abstract

Defect states dominate the performance of low-dimensional nanoelectronics, which deteriorate the serviceability of devices in most cases. But in recent years, some intriguing functionalities are discovered by defect engineering. In this work, we demonstrate a bifunctional memory device of a MoS2/BiFeO3/SrTiO3 van der Waals heterostructure, which can be programmed and erased by solely one kind of external stimuli (light or electrical-gate pulse) via engineering of oxygen-vacancy-based solid-ionic gating. The device shows multibit electrical memory capability (>22 bits) with a large linearly tunable dynamic range of 7.1 × 106 (137 dB). Furthermore, the device can be programmed by green- and red-light illuminations and then erased by UV light pulses. Besides, the photoresponse under red-light illumination reaches a high photoresponsivity (6.7 × 104 A/W) and photodetectivity (2.12 × 1013 Jones). These results highlighted solid-ionic memory for building up multifunctional electronic and optoelectronic devices.

Original languageEnglish
Pages (from-to)221-231
Number of pages11
JournalACS Nano
Volume16
Issue number1
DOIs
Publication statusPublished - Jan 25 2022
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2022 American Chemical Society

ASJC Scopus Subject Areas

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

Keywords

  • BiFeO
  • MoS
  • multifunctional memory
  • oxygen vacancy
  • solid-ionic transistor

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