TY - GEN
T1 - Study of carbon nanotube flip-chip methodology for interconnect technology via electromagnetic and circuit model approach
AU - Brun, Christophe
AU - Chong, Yap Chin
AU - Tan, Dunlin
AU - Teo Hang Tong, Edwin
AU - Bila, Stéphane
AU - Verdeyme, Serge
AU - Baillargeat, Dominique
AU - Tay, Beng Kang
PY - 2011
Y1 - 2011
N2 - Due to their excellent electronic and thermal properties, carbon nanotubes (CNTs) are considered as promising candidates for circuit interconnects. In this paper, we show for the first time both a theoretical and experimental analysis of CNT based flip-chip interconnects in the microwave domain. Two theoretical models of CNT were defined and compared exhibiting good agreement: one is based on electromagnetic simulations whereas the second one is based on circuit simulations. Finally, promising experimental studies were done in order to demonstrate the principle of the CNTs based flip-chip interconnect.
AB - Due to their excellent electronic and thermal properties, carbon nanotubes (CNTs) are considered as promising candidates for circuit interconnects. In this paper, we show for the first time both a theoretical and experimental analysis of CNT based flip-chip interconnects in the microwave domain. Two theoretical models of CNT were defined and compared exhibiting good agreement: one is based on electromagnetic simulations whereas the second one is based on circuit simulations. Finally, promising experimental studies were done in order to demonstrate the principle of the CNTs based flip-chip interconnect.
KW - Carbon nanotubes
KW - growth
KW - interconnection
KW - microwave
KW - modeling
UR - http://www.scopus.com/inward/record.url?scp=80052313907&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=80052313907&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2011.5972784
DO - 10.1109/MWSYM.2011.5972784
M3 - Conference contribution
AN - SCOPUS:80052313907
SN - 9781612847566
T3 - IEEE MTT-S International Microwave Symposium Digest
BT - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011
T2 - 2011 IEEE MTT-S International Microwave Symposium, IMS 2011
Y2 - 5 June 2011 through 10 June 2011
ER -