Study of Ru barrier failure in the Cu/Ru/Si system

Martina Damayanti*, T. Sritharan, S. G. Mhaisalkar, E. Phoon, L. Chan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Study of Ru barrier failure in the Cu/Ru/Si system'. Together they form a unique fingerprint.

Engineering

Keyphrases

Material Science