Super-resolved thickness maps using ultrahigh resolution OCT

Valentin Aranha Dos Santos, Leopold Schmetterer, Graham J. Triggs, Rainer A. Leitgeb, René M. Werkmeister

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

OCT imaging in the super-resolution regime was investigated using simulations and experiments. Samples of known thickness in the range 46-163 nm were fabricated and imaged. Measurements of the tear film lipid layer were performed.

Original languageEnglish
Title of host publicationOptical Coherence Imaging Techniques and Imaging in Scattering Media II
EditorsWang-Yuhl Oh, Maciej Wojtkowski, Stephen A. Boppart
PublisherSPIE
ISBN (Electronic)9781510612907
DOIs
Publication statusPublished - 2017
Externally publishedYes
EventOptical Coherence Imaging Techniques and Imaging in Scattering Media II 2017 - Munich, Germany
Duration: Jun 25 2017Jun 29 2017

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
Volume10416
ISSN (Print)1605-7422

Conference

ConferenceOptical Coherence Imaging Techniques and Imaging in Scattering Media II 2017
Country/TerritoryGermany
CityMunich
Period6/25/176/29/17

Bibliographical note

Publisher Copyright:
© 2017 SPIE.

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Biomaterials
  • Radiology Nuclear Medicine and imaging

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