Super-resolved thickness maps using ultrahigh-resolution OCT

Valentin Aranha dos Santos, Leopold Schmetterer, Graham J. Triggs, Rainer A. Leitgeb, René M. Werkmeister*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

OCT imaging in the super-resolution regime was investigated using simulations and experiments. Samples of known thickness in the range 46-163 nm were fabricated and imaged. Measurements of the tear film lipid layer were performed.

Original languageEnglish
Title of host publicationEuropean Conference on Biomedical Optics, ECBO 2017
PublisherOptica Publishing Group (formerly OSA)
ISBN (Electronic)9781509067367
DOIs
Publication statusPublished - 2017
Externally publishedYes
EventEuropean Conference on Biomedical Optics, ECBO 2017 - Munich, Germany
Duration: Jun 25 2017Jun 29 2017

Publication series

NameOptics InfoBase Conference Papers
VolumePart F61-ECBO 2017
ISSN (Electronic)2162-2701

Conference

ConferenceEuropean Conference on Biomedical Optics, ECBO 2017
Country/TerritoryGermany
CityMunich
Period6/25/176/29/17

Bibliographical note

Publisher Copyright:
© 2017 SPIE-OSA.

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Super-resolved thickness maps using ultrahigh-resolution OCT'. Together they form a unique fingerprint.

Cite this