Synthesis of organically modified mesoporous silica as a low dielectric constant intermetal dielectric

Suzhu Yu*, Terence K.S. Wong, Kantisara Pita, Xiao Hu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

33 Citations (Scopus)

Abstract

Uniform mesoporous silica films with a dielectric constant of about 2.0 were produced using multiple-step sol-gel process. The dielectric constant of the film, with equal amount of TEOS and MTES, was found to increase from 1.9 to 2.2 in the first five day and then change slightly when the film was subjected to aging at ambient environment over 40 days. FTIR analysis of the films demonstrates that there was very little water present and gives an important clue to their composition and structure.

Original languageEnglish
Pages (from-to)2036-2042
Number of pages7
JournalJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Volume20
Issue number5
DOIs
Publication statusPublished - Sept 2002
Externally publishedYes

ASJC Scopus Subject Areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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