Abstract
Uniform mesoporous silica films with a dielectric constant of about 2.0 were produced using multiple-step sol-gel process. The dielectric constant of the film, with equal amount of TEOS and MTES, was found to increase from 1.9 to 2.2 in the first five day and then change slightly when the film was subjected to aging at ambient environment over 40 days. FTIR analysis of the films demonstrates that there was very little water present and gives an important clue to their composition and structure.
Original language | English |
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Pages (from-to) | 2036-2042 |
Number of pages | 7 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 20 |
Issue number | 5 |
DOIs | |
Publication status | Published - Sept 2002 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Condensed Matter Physics
- Electrical and Electronic Engineering