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Thermal stability of strained Si/Si1-xGex heterostructures for advanced microelectronics devices
L. H. Wong*, C. C. Wong, K. K. Ong, J. P. Liu, L. Chan, R. Rao, K. L. Pey, L. Liu, Z. X. Shen
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
7
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(Scopus)