TY - JOUR
T1 - Thickness dependency of field emission in amorphous and nanostructured carbon thin films
AU - Shakerzadeh, Maziar
AU - Teo, Edwin Hang Tong
AU - Tay, Beng Kang
PY - 2012
Y1 - 2012
N2 - Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp2-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission.
AB - Thickness dependency of the field emission of amorphous and nanostructured carbon thin films has been studied. It is found that in amorphous and carbon films with nanometer-sized sp2 clusters, the emission does not depend on the film thickness. This further proves that the emission happens from the surface sp2 sites due to large enhancement of electric field on these sites. However, in the case of carbon films with nanocrystals of preferred orientation, the emission strongly depends on the film thickness. sp2-bonded nanocrystals have higher aspect ratio in thicker films which in turn results in higher field enhancement and hence easier electron emission.
KW - Carbon films
KW - Field emission
KW - Preferred orientation
UR - http://www.scopus.com/inward/record.url?scp=84864018554&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84864018554&partnerID=8YFLogxK
U2 - 10.1186/1556-276X-7-286
DO - 10.1186/1556-276X-7-286
M3 - Article
AN - SCOPUS:84864018554
SN - 1931-7573
VL - 7
JO - Nanoscale Research Letters
JF - Nanoscale Research Letters
M1 - 286
ER -