Thin film aluminum-gold interface interactions

C. Xu; T. Sritharan; S. G. Mhaisalkar

doi:10.1016/j.scriptamat.2006.09.038

Thin film aluminum-gold interface interactions

C. Xu, T. Sritharan^*, S. G. Mhaisalkar

^*Corresponding author for this work

Nanyang Technological University

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

Thin film diffusion couples of 1 μm Au with 0.3 μm and 1 μm Al were annealed at different temperatures and for different times and the resulting interface reactions were tracked by X-ray diffraction and electron microscopy. The phase formation sequence was identified and the interface microstructure was shown to consist of layers of the different phases. Interface tracking by secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness measurements were made and the activation energy calculated.

Original language	English
Pages (from-to)	549-552
Number of pages	4
Journal	Scripta Materialia
Volume	56
Issue number	6
DOIs	https://doi.org/10.1016/j.scriptamat.2006.09.038
Publication status	Published - Mar 2007
Externally published	Yes

ASJC Scopus Subject Areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys

Keywords

Intermetallic compounds
Secondary ion mass spectroscopy (SIMS)
Thin films

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10.1016/j.scriptamat.2006.09.038

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title = "Thin film aluminum-gold interface interactions",

abstract = "Thin film diffusion couples of 1 μm Au with 0.3 μm and 1 μm Al were annealed at different temperatures and for different times and the resulting interface reactions were tracked by X-ray diffraction and electron microscopy. The phase formation sequence was identified and the interface microstructure was shown to consist of layers of the different phases. Interface tracking by secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness measurements were made and the activation energy calculated.",

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author = "C. Xu and T. Sritharan and Mhaisalkar, {S. G.}",

year = "2007",

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journal = "Scripta Materialia",

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AU - Xu, C.

AU - Sritharan, T.

AU - Mhaisalkar, S. G.

PY - 2007/3

Y1 - 2007/3

N2 - Thin film diffusion couples of 1 μm Au with 0.3 μm and 1 μm Al were annealed at different temperatures and for different times and the resulting interface reactions were tracked by X-ray diffraction and electron microscopy. The phase formation sequence was identified and the interface microstructure was shown to consist of layers of the different phases. Interface tracking by secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness measurements were made and the activation energy calculated.

AB - Thin film diffusion couples of 1 μm Au with 0.3 μm and 1 μm Al were annealed at different temperatures and for different times and the resulting interface reactions were tracked by X-ray diffraction and electron microscopy. The phase formation sequence was identified and the interface microstructure was shown to consist of layers of the different phases. Interface tracking by secondary ion mass spectroscopy depth profiling showed that Au is the predominant diffusant in this system. Intermetallic thickness measurements were made and the activation energy calculated.

KW - Intermetallic compounds

KW - Secondary ion mass spectroscopy (SIMS)

KW - Thin films

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U2 - 10.1016/j.scriptamat.2006.09.038

DO - 10.1016/j.scriptamat.2006.09.038

M3 - Article

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SP - 549

EP - 552

JO - Scripta Materialia

JF - Scripta Materialia

IS - 6

ER -

Thin film aluminum-gold interface interactions

Abstract

ASJC Scopus Subject Areas

Keywords

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