Abstract
Thin films of lithium niobate are derived on SiO2/Si substrate by the sol-gel method. The solution is prepared by mixing LiOC2H5 and Nb(OC2H5)5. The films are deposited by spin coating and are annealed at different temperatures of 400 °C, 500 °C, 600 °C and 700 °C. The films are characterized by means of X-ray diffraction, atomic force microscopy and variable: angle spectrosopic ellipsometry. The experimental results show that when the heat treatment temperature is about 500 °C, the films starts to crystallize and the desirable ferroelectric phase dominates. The crystalline size of the 500 °C annealed film ranges from 39nm to 86nm and the film is microscopically continuous and uniform. The refractive index of the film found to be 1.83 at the wavelength of 633nm. The nanocrystalline nature, the ferroelectric phase and the refractive index of the films make them potential candidates for active integrated optical component applications.
Original language | English |
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Pages (from-to) | 462-466 |
Number of pages | 5 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 3491 |
DOIs | |
Publication status | Published - 1998 |
Externally published | Yes |
Event | Proceedings of the 1998 International Conference on Applications of Photonic Technology, ICAPT - Ottawa, Can Duration: Jul 29 1998 → Jul 31 1998 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering