Thin films: Stress, strain and structure-property relations

Mark Yeadon; Zeng Kaiyang; Hng Huey Hoon; Ray D. Twesten; Robin Abothu

doi:10.1016/S0040-6090(02)00899-4

Thin films: Stress, strain and structure-property relations

Mark Yeadon^*, Zeng Kaiyang, Hng Huey Hoon, Ray D. Twesten, Robin Abothu

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

Original language	English
Pages (from-to)	1
Number of pages	1
Journal	Thin Solid Films
Volume	424
Issue number	1
DOIs	https://doi.org/10.1016/S0040-6090(02)00899-4
Publication status	Published - Jan 22 2003
Externally published	Yes
Event	proceedings of the 1st Ineternational Conference on Materials - Singapore, Singapore Duration: Jul 1 2001 → Jul 6 2001

ASJC Scopus Subject Areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/S0040-6090(02)00899-4

Cite this

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AU - Yeadon, Mark

AU - Kaiyang, Zeng

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AU - Twesten, Ray D.

AU - Abothu, Robin

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Y2 - 1 July 2001 through 6 July 2001

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Thin films: Stress, strain and structure-property relations

ASJC Scopus Subject Areas

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