Abstract
Understanding the origin, the trend and the scale of the relative change of the mechanical strength and the dielectric properties of a nanometric solid is of great importance in designing solid-state device. Here we present a model that describes the nature and behavior of a nanosolid including spherical dots, wires and ultrathin films. Consistency between predictions and experimental observations confirms that the size-driven property-change originates from the chemical bond contraction at surface and the rise in the surface-to-volume ratio of the nanosolid. It is found that the bond contracts by as high as 14% and the corresponding Young's modulus increase by 100% at surface, and that the dielectric constant of semiconductors decreases with reducing the dimension of the solid, which leads to the blue shift in the photoluminescence and absorption edges.
| Original language | English |
|---|---|
| Pages (from-to) | 302-308 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4228 |
| DOIs | |
| Publication status | Published - 2000 |
| Externally published | Yes |
| Event | Design, Modeling, and Simulation in Microelectronics - Singapure, Singapore Duration: Nov 28 2000 → Nov 30 2000 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Keywords
- Dielectric constant
- Mechanical strength
- Nanotechnology
- Photoluminescence
- Photon absorption
- Solid-state device
- Surface and interface